from reliability to security of devices
| Description | |
| Date | 2021 |
| Date | |
| Auteurs | Tria,- A | Fournier,- J | |
| Source | Tech. Dig. Int. Electron Meet. IEDM |
| Résumé | Reliability issues have been a major concern for the development of electronic devices, with the rapid evolution of constantly shrinking technologies and the growing demand and emergence of new applications. However, malevolent 'controlled' attempts to operate those devices at the 'physical limits' or under stringent physical conditions have posed serious security issues for critical applications. With the emergence of new generations of integrated circuits and democratization of critical IoT applications, new challenges have to be met to address those security issues. New approaches have to be sought to address both reliability and security. © 2021 IEEE. |
| DOI | 10.1109/IEDM19574.2021.9720637 |
| Type de documents | |
| Impact Factor | |