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Characterization of spectrometric photon-counting X-ray detectors at different pitches

Published on 29 March 2018
Characterization of spectrometric photon-counting X-ray detectors at different pitches
Description
 
Date 
Authors
Jurdit M., Brambilla A., Moulin V., Ouvrier-Buffet P., Radisson P., Verger L.
Year2017-0456
Source-TitleJournal of Instrumentation
Affiliations
Univ. Grenoble Alpes, CEA, LETI, MINATEC Campus, 17 Rue des martyrs, Grenoble Cedex 9, France, MULTIX S.A., C/O Thales Electron Devices SA, Z.I. centr'Alp, 460 Rue du Pommarin, Moirans, France
Abstract
There is growing interest in energy-sensitive photon-counting detectors based on high flux X-ray imaging. Their potential applications include medical imaging, non-destructive testing and security. Innovative detectors of this type will need to count individual photons and sort them into selected energy bins, at several million counts per second and per mm2. Cd(Zn)Te detector grade materials with a thickness of 1.5 to 3 mm and pitches from 800 ?m down to 200 ?m were assembled onto interposer boards. These devices were tested using in-house-developed full-digital fast readout electronics. The 16-channel demonstrators, with 256 energy bins, were experimentally characterized by determining spectral resolution, count rate, and charge sharing, which becomes challenging at low pitch. Charge sharing correction was found to efficiently correct X-ray spectra up to 40 × 106 incident photons.s-1.mm-2. © 2017 IOP Publishing Ltd and Sissa Medialab.
Author-Keywords
CdTe, charge sharing, CZT, energy-resolved photon counting detectors, high count rate, small pixels, X-ray detectors
Index-Keywords
Bins, Digital devices, Medical imaging, Nondestructive examination, X ray analysis, X ray apparatus, CdTe, Charge sharing, High-count rate, Photon counting detectors, X-ray detector, Photons
ISSN17480221
LinkLink

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