innovation for industry
In the SUPERAID7 project, the variability induced by different sources of process variation has been investigated in relation to the performance of Gate-All-Around Stacked-Nanosheet MOSFET. After fabricating devices, the CEA-Leti-NSP model was developed, validated and calibrated using experimental data. Subsequently, the extracted variability-aware compact models demonstrated how different process parameters can affect different aspects of circuit behavior, which is a key issue for future advanced CMOS technology nodes.
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CEA is a French government-funded technological research organisation in four main areas: low-carbon energies, defense and security, information technologies and health technologies. A prominent player in the European Research Area, it is involved in setting up collaborative projects with many partners around the world.